ISO/TR 15969:2001 PDF

ISO/TR 15969:2001 PDF

Name:
ISO/TR 15969:2001 PDF

Published Date:
06/01/2001

Status:
Active

Description:

Surface chemical analysis - Depth profiling - Measurement of sputtered depth

Publisher:
International Organization for Standardization (Technical Report)

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$21.9
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This Technical Report gives guidelines for measuring the sputtered depth in sputtered depth profiling. The methods of sputtered depth measurement described in this Technical Report are applicable to techniques of surface chemical analysis when used in combination with ion bombardment for the removal of a part of a solid sample to a typical sputtered depth of up to several micrometres.


File Size : 1 file , 870 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 12
Published : 06/01/2001
Same As : ISO/TR 15969:2001

History

ISO/TR 15969:2021
Published Date: 03/01/2021
Surface chemical analysis - Depth profiling - Measurement of sputtered depth
$37.2
ISO/TR 15969:2001
Published Date: 06/01/2001
Surface chemical analysis - Depth profiling - Measurement of sputtered depth
$21.9

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